Design-For-Test for Digital Ic's & Embedded Core Systems

Design-For-Test for Digital Ic's & Embedded Core Systems

Product ID: 0130848271 Condition: USED (All books in used condition)

Payflex: Pay in 4 interest-free payments of R230.00. Read the FAQ
R 920
includes Duties & VAT
Delivery: 10-20 working days
Ships from USA warehouse.
Secure Transaction
VISA Mastercard payflex ozow

Product Description

Condition - Very Good

The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.

Design-For-Test for Digital Ic's & Embedded Core Systems

Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.

Technical Specifications

Country
USA
Brand
Prentice Hall
Manufacturer
Prentice Hall
Binding
Paperback
UnitCount
1
UPCs
076092030379
EANs
9780130848277