Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
| Country | USA |
| Brand | Butterworth-Heinemann |
| Manufacturer | Butterworth-Heinemann |
| Binding | Paperback |
| ReleaseDate | 1994-04-21 |
| UnitCount | 1 |
| EANs | 9780340600344 |