Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
| Country | USA |
| Manufacturer | Solly N. |
| Binding | Paperback |
| ItemPartNumber | Refer to Sapnet. |
| UnitCount | 1 |
| EANs | 9780645746709 |
| ReleaseDate | 0000-00-00 |