Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
| Country | USA |
| Brand | McGraw-Hill Education |
| Manufacturer | McGraw-Hill Science/Engineering/Math |
| Binding | Paperback |
| EANs | 9780072825756 |
| ReleaseDate | 0000-00-00 |