Artech House

Intro to Infra & Elec-Opt.Sys.2e Hb (Artech Optoelectronics and Applied Optics)

Free shipping with 3 or more products in your cart
Payflex: Pay in 4 interest-free payments of R1,526.50. Read the FAQ
R 6,106
In stock
Low stock in USA warehouse Order soon to secure your order
Used, Good Condition
Duties, insurance and VAT included
Delivered in 10–20 working days —
Free shipping with 3 or more products in your cart
Secure checkout
Your payment is fully protected
Duties & VAT included
No surprise charges at the door
Tracked delivery
Track your order end to end
Returns support
30-day return window

Description

Condition - Very Good

The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.

This newly revised and updated edition of a classic Artech House book offers a current and complete introduction to the analysis and design of Electro-Optical (EO) imaging systems. The Second Edition provides numerous updates and brand new coverage of today s most important areas, including the integrated spatial frequency approach and a focus on the weapons of terrorists as objects of interest.

This comprehensive reference details the principles and components of the Linear Shift-Invariant (LSI) infrared and electro-optical systems and shows you how to combine this approach with calculus and domain transformations to achieve a successful imaging system analysis. Ultimately, the steps described in this book lead to results in quantitative characterizations of performance metrics such as modulation transfer functions, minimum resolvable temperature difference, minimum resolvable contrast, and probability of object discrimination.

The book includes an introduction to two-dimensional functions and mathematics which can be used to describe image transfer characteristics and imaging system components. You also learn diffraction concepts of coherent and incoherent imaging systems which show you the fundamental limits of their performance. By using the evaluation procedures contained in this desktop reference, you become capable of predicting both sensor test and field performance and quantifying the effects of component variations. This practical resource includes over 780 time-saving equations.

Contents: Introduction. Mathematics. LSI Systems. Diffraction. Sources of Radiation. Atmospherics. Optics. Detectors and Scanners. Electronics. Signal Processing Displays on Human Perception. Historical Performance Models. CTF and the TTP Metric. EO/IR Systems and Target Acquisition. Search. Laboratory and Field Testing.

Shipping & Delivery

Your order is shipped from the USA and delivered to your door in South Africa in 10–20 working days. All items are fully tracked.

Returns & Exchanges

We offer a 30-day return window. If something isn't right, contact our support team and we'll make it right.