☰

Engineering & Transportation

Materials & Material Science

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)

R 5,961

or 4 x payments of R1,490.25 with Payflex

Payflex

Availability: Currently in Stock

Delivery: 10-20 working days

Please be aware orders placed now may not arrive in time for Christmas, please check delivery times.

Condition: USED (All books are in used condition)

Condition - Very Good
The item shows wear from consistent use, but it remains in good condition and functions properly. Item may arrive with damaged packaging or be repackaged. It may be marked, have identifying markings on it, or have minor cosmetic damage. It may also be missing some parts/accessories or bundled items.

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Country USA
Brand Springer
Manufacturer Springer
Binding Hardcover
ItemPartNumber 260 black & white illustrations, 47 blac
ReleaseDate 1998-09-17
UnitCount 1
Format Illustrated
EANs 9783540639763

You might also like...

Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences)

Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences)