Semiconductor Device and Failure Analysis : Using Photon

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Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference:
* Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and ESD reliability.
* Presents the principles of design and calibration for a spectroscopic emission microscope system along with coverage of the three main operation modes: frontside, backside and spectroscopic PEM
* Provides an analysis of light emission in semiconductors under hot-carrier and high-field impulse stressing in MOS transistors and photon emission from biased MOS capacitors.
Not only an essential reference for researchers and students in the field, the numerous practical examples throughout the text also make this an indispensible guide for failure analysis engineers and microelectrics industry professionals.
Country USA
Brand Wiley
Manufacturer Wiley
Binding Hardcover
ItemPartNumber 9780471492405
UnitCount 1
EANs 9780471492405
ReleaseDate 0000-00-00

Country	USA
Brand	Wiley
Manufacturer	Wiley
Binding	Hardcover
ItemPartNumber	9780471492405
UnitCount	1
EANs	9780471492405
ReleaseDate	0000-00-00

Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

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