Transmission electron microscopy of silicon VLSI circuits and structures
Product ID: 0471092517
Condition: USED (All books in used condition)
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Transmission electron microscopy of silicon VLSI circuits and structures
APPLICATION OF TRANSMISSION ELECTRON MICROSCOPY (TEM)
Technical Specifications
Country
USA
Manufacturer
Wiley
Binding
Paperback
UnitCount
1
EANs
9780471092513







