Morgan Kaufmann

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

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Condition - Very Good

The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
  • Most up-to-date coverage of design for testability.
  • Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
  • Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
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