Scanning Transmission Electron Microscopy: Imaging and Analysis

Scanning Transmission Electron Microscopy: Imaging and Analysis

Product ID: 1441971998 Condition: USED (All books in used condition)

Payflex: Pay in 4 interest-free payments of R2,142.75. Read the FAQ
R 8,571
includes Duties & VAT
Delivery: 10-20 working days
Ships from USA warehouse.
Secure Transaction
VISA Mastercard payflex ozow

Product Description

Condition - Very Good

The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.

Scanning Transmission Electron Microscopy: Imaging and Analysis

  • Used Book in Good Condition

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Hardcover
ItemPartNumber
30529150
ReleaseDate
2011-03-22T00:00:01Z
UnitCount
1
EANs
9781441971999