Transmission Electron Microscopy: Diffraction, Imaging, and

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Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from todayâ€™s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challengingâ€•the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science
Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Country USA
Brand Springer
Manufacturer Springer
Binding Hardcover
ItemPartNumber 43903781
UnitCount 1
EANs 9783319266497
ReleaseDate 0000-00-00

Country	USA
Brand	Springer
Manufacturer	Springer
Binding	Hardcover
ItemPartNumber	43903781
UnitCount	1
EANs	9783319266497
ReleaseDate	0000-00-00

Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry

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